4.2.3.b : Propagation in vacuum (Phase decorrelation view) Activate Navigation Menu 4.2.4 : Propagation in dielectric materials

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Ph.D.

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{ Web Version }

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Table of Contents

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{ Abstract / Résumé }

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Chapter 1

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Chapter 2

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Chapter 3

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Chapter 4

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4.1

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{ 4.2 }

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4.2.1

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4.2.2

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{ 4.2.3 }

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4.2.3.a

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4.2.3.b

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4.2.3.c

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4.2.4

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4.2.5

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4.3

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{ 4.4 }

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{ 4.5 }

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4.6

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4.7

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Chapter 5

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Chapter 6

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Chapter 7

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Chapter 8

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Appendix

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4.2.3.a : Propagation in vacuum (Michelson interferometer example)

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4.2.3.b : Propagation in vacuum (Phase decorrelation view)

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4.2.3.c : Propagation in vacuum (Coherence time and coherence length)

4.2        OLCR measurement of the complex impulse response

4.2.3       Propagation in vacuum

c)   Coherence time and coherence length

The time distance tc where significant interference signal is observed is the coherence time of the light source. Several definitions of tc are found in the literature and the two principal ones are given hereafter. One possibility is to take the power equivalent width


(4-13)


The other way is to take from the g(t) function the full width at half maximum (FWHM) t3dB or at 1/e of the maximum t1/e. For a Gaussian light source with FWHM spectral range of Dn, the relation between tc, t3dB and Dn is




(4-14)


where l and Dl are the central wavelength and the FWHM wavelength range of the source respectively. The detailed algebraic manipulations are found in [4-6] for tc and in appendix D for tc,3dB.

The light source coherence length Lc is defined as the travel distance for a time corresponding to the coherence time, that is Lc = tc,3dB×c0 in vacuum. For a Gaussian light source centered at 1300nm with a spectral width of 40 nm, the corresponding coherence length is 37 mm.

The spectral power density S(n) can be obtained from the experimental determination g(t) by a Fourier transform. This spectroscopic method is widely used in the infrared and it is known as the Fourier spectroscopy.



4.2.3.b : Propagation in vacuum (Phase decorrelation view) Activate Navigation Menu 4.2.4 : Propagation in dielectric materials